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FOUR_PROBE_APPARATUS

Four Probe Apparatus

Experimental Setup to determine resistivity of semiconductors by four probe method at different Temperatures & Determination of Band gap

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Description

Scope : Resistivity of semiconductors by four probe method at different Temperatures & Determination of Bandgap

Features : Resistivity of semiconductors by four probe method at different Temperatures & Determination of Band gap
The experiment consists of the following :
> Four Probe Arrangement
> Oven (upto 200ºC)
> Sample : Ge Crystal mounted
> Thermometer (0-200ºC)
> Four Probe Setup
(a) Constant Current power supply digital Accuracy : +0.25% of the reading +1 digit Load Regulation : 0.03% for no load to full load
(b)Electronic Millivoltmeter 200 mV Accuracy : + 0.1% of reading = 1 digit Impedence : 1 Mohm
Display : 3 digit, 7 segment LED (12.5mm) height with auto polarity and decimal indication
.
We are committed to the continuous development of our products, and therefore reserve the right to
amend specifications without prior notice

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